我有一台配备 SSD 的笔记本电脑，最近它不断给我一些奇怪的错误，我不确定这是软件问题还是硬件问题。因此，我使用 smartctl 工具检查了我的 SSD：
[root@laptop matthias]# smartctl -a /dev/sda
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.9.35-1-lts] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA THNSFJ256GDNU
Serial Number: X57S10LDTBZW
LU WWN Device Id: 5 00080d 9104b419d
Firmware Version: JULA1102
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Jul 5 18:45:20 2017 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 7350
10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 2795
167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
173 Unknown_Attribute 0x0012 187 187 000 Old_age Always - 0
175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 91
194 Temperature_Celsius 0x0022 055 032 000 Old_age Always - 45 (Min/Max 19/68)
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 1182 hours (49 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 88 18 dc b7 40 Error: ICRC, ABRT at LBA = 0x00b7dc18 = 12049432
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 e8 88 18 dc b7 40 08 00:05:05.866 WRITE FPDMA QUEUED
61 90 80 80 da b7 40 08 00:05:05.865 WRITE FPDMA QUEUED
61 78 78 00 d8 b7 40 08 00:05:05.852 WRITE FPDMA QUEUED
61 08 70 48 d3 b7 40 08 00:05:05.852 WRITE FPDMA QUEUED
61 00 68 50 bb b7 40 08 00:05:05.836 WRITE FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
我不知道该如何解读这个输出。我看到的都是大量老旧数据和预故障数据。我的 SSD 是不是要坏了？
我也运行了这个：
[root@laptop matthias]# smartctl -l selftest /dev/sda
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.9.35-1-lts] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF READ SMART DATA SECTION ===
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 7350