我买了一台翻新的笔记本电脑（戴尔 Latitude），并对其光盘（Hynix SC311 512GB）运行光盘检查，发现磨损次数有两个不同的值，而且这不是单一实例，因为我有另一台笔记本电脑（戴尔 Latitude），具有相同的光盘型号（Hynix SC311 256GB），并且我在 smartctl 和 crystalDiscInfo 上都检查了类似的情况。
我在网上搜索过，但没有找到任何类似的东西，因为Wear_Leveling_Count总是相同或非常相似的值
- 为什么这些价值观不同？
- 我的光盘的寿命已经走到尽头了吗？
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.13-200.fc37.x86_64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SK hynix SATA SSDs
Device Model: SK hynix SC311 SATA 512GB
Firmware Version: 70000P10
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Feb 26 15:41:25 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4700) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 166 166 006 Pre-fail Always - 0
5 Retired_Block_Count 0x0032 253 253 036 Old_age Always - 0
9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7299
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 1681
100 Total_Erase_Count 0x0032 100 100 000 Old_age Always - 1387006
168 Min_Erase_Count 0x0032 100 100 000 Old_age Always - 6
169 Max_Erase_Count 0x0032 097 097 000 Old_age Always - 54
174 Unexpect_Power_Loss_Ct 0x0030 100 100 000 Old_age Offline - 112
175 Program_Fail_Count_Chip 0x0032 253 253 000 Old_age Always - 0
176 Unused_Rsvd_Blk_Cnt_Tot 0x0032 253 253 000 Old_age Always - 0
177 Wear_Leveling_Count 0x0032 099 001 000 Old_age Always - 25
178 Used_Rsvd_Blk_Cnt_Chip 0x0032 253 253 000 Old_age Always - 0
179 Used_Rsvd_Blk_Cnt_Tot 0x0032 253 253 000 Old_age Always - 0
180 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 1213
181 Non4k_Aligned_Access 0x0032 253 253 000 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 253 253 000 Old_age Always - 0
184 End-to-End_Error 0x0032 253 253 000 Old_age Always - 0
187 Reported_Uncorrect 0x0032 253 253 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 191
194 Temperature_Celsius 0x0002 029 010 000 Old_age Always - 29 (Min/Max 10/86)
195 Hardware_ECC_Recovered 0x0032 253 253 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 253 253 036 Old_age Always - 0
198 Offline_Uncorrectable 0x0032 253 253 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x0032 253 253 000 Old_age Always - 0
204 Soft_ECC_Correction 0x000e 067 001 000 Old_age Always - 1167
212 Phy_Error_Count 0x0032 100 100 000 Old_age Always - 24177594
233 Media_Wearout_Indicator 0x0032 002 001 000 Old_age Always - 99
234 Unknown_SK_hynix_Attrib 0x0032 100 100 000 Old_age Always - 25201546768
241 Total_Writes_GB 0x0032 100 100 000 Old_age Always - 46922154249
242 Total_Reads_GB 0x0032 100 100 000 Old_age Always - 70059685890
SMART Error Log Version: 0
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 7299 -
# 2 Short offline Completed without error 00% 7297 -
# 3 Extended offline Aborted by host 50% 7255 -
# 4 Short offline Completed without error 00% 7254 -
# 5 Short offline Completed without error 00% 0 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.