我有 WD elements 2TB。我尝试过删除或格式化它，但没有成功。花了很长时间，超过3天，但什么也没发生。进度停留在1%。
另外，尝试检查坏扇区在 30 分钟后不会继续
:~$ sudo badblocks -svw -o badblocks.log /dev/sdc
Checking for bad blocks in read-write mode
From block 0 to 1953481727
Testing with pattern 0xaa: 0.01% done, 31:34 elapsed. (0/0/0 errors)
这是 (smartctl --all) 的输出
~$ sudo smartctl --all /dev/sdd
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-52-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD20NMVW-11AV3S2
Serial Number: WD-WX21E949F5A4
LU WWN Device Id: 5 0014ee 20b794cca
Firmware Version: 01.01A01
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Nov 3 23:08:31 2022 +03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37620) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 415) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 49
3 Spin_Up_Time 0x0027 216 193 021 Pre-fail Always - 4166
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1535
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2221
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1407
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1370
193 Load_Cycle_Count 0x0032 187 187 000 Old_age Always - 40166
194 Temperature_Celsius 0x0022 107 101 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:23.524 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
Error 6 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 06 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
Error 5 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
Error 4 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
Error 3 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:00:17.757 SMART READ DATA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
它死了还是我可以修复它？
PS：我使用的是Ubuntu 22.04
答案1
那个磁盘快要死了。
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
让我们看看 SMART 属性：
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
...
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
...
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
该故障消息是由内部重新分配的扇区计数达到限制而触发的：磁盘上（至少）有 2805 个块无法再读取，并且已被磁盘本身内部重定向到备用块。
重新分配的事件计数（原始值）为 198，这表明平均一次在超过 10 个失败块的区域中检测到了这 2805 个块。这表明磁盘表面可能存在明显的物理损坏区域。任何软件命令都无法解决这个问题。
（例如，如果磁盘在通电时受到敲击，则读/写头可能实际上接触了磁盘表面，导致实际的磁性材料从该区域剧烈剥落。由此产生的磁尘可能会堵塞读/写头，降低其性能，或落在其他地方导致其他问题。
并且寻道错误率（缩放值）似乎距离其失败阈值仅一步之遥（尽管阈值为“0”）。如果该指示正确，则磁盘的启动自检可能会失败，并且随时变得完全无法访问。
基本上，磁盘仍然可以工作的唯一原因是它正在尽力为您提供最后一次机会来备份可能仍然可读的任何重要数据。
是时候报废该磁盘并购买新磁盘了。如果您需要确保其中的所有数据都无法恢复，请打开磁盘盒，取出磁盘盘片，将它们放入塑料袋（以容纳任何可能的弹片）中，然后用最大的锤子将它们砸成碎片。您可以轻松地将对象用于该目的。
有人说（转述）：“所有硬盘最终都只是磨损的机器；数据存储只是暂时的副作用。”