之前的硬盘有 SMART 错误或者需要更换吗?

之前的硬盘有 SMART 错误或者需要更换吗?

我聪明地运行,发现了一些奇怪的错误,尽管磁盘很新 Power_On_Minutes 427h+41m

我很好奇,这些是以前硬盘的错误吗?

Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours)
  When the command that caused the error occurred, the device was active or idle
Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

输出如下

# smartctl --all /dev/sda
    smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-51-generic] (local build)
    Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

    === START OF INFORMATION SECTION ===
    Model Family:     Toshiba 2.5" HDD MK..76GSX
    Device Model:     TOSHIBA MK2576GSX
    Serial Number:    Y1J9S0IGS
    LU WWN Device Id: 5 000039 3a5a06b8e
    Firmware Version: GS001A
    User Capacity:    250,059,350,016 bytes [250 GB]
    Sector Size:      512 bytes logical/physical
    Rotation Rate:    5400 rpm
    Form Factor:      2.5 inches
    Device is:        In smartctl database [for details use: -P show]
    ATA Version is:   ATA8-ACS (minor revision not indicated)
    SATA Version is:  SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
    Local Time is:    Thu Dec  1 00:28:22 2016 GMT
    SMART support is: Available - device has SMART capability.
    SMART support is: Enabled

    === START OF READ SMART DATA SECTION ===
    SMART overall-health self-assessment test result: PASSED

    General SMART Values:
    Offline data collection status:  (0x00) Offline data collection activity
                                            was never started.
                                            Auto Offline Data Collection: Disabled.
    Self-test execution status:      (   0) The previous self-test routine completed
                                            without error or no self-test has ever
                                            been run.
    Total time to complete Offline
    data collection:                (  120) seconds.
    Offline data collection
    capabilities:                    (0x5b) SMART execute Offline immediate.
                                            Auto Offline data collection on/off support.
                                            Suspend Offline collection upon new
                                            command.
                                            Offline surface scan supported.
                                            Self-test supported.
                                            No Conveyance Self-test supported.
                                            Selective Self-test supported.
    SMART capabilities:            (0x0003) Saves SMART data before entering
                                            power-saving mode.
                                            Supports SMART auto save timer.
    Error logging capability:        (0x01) Error logging supported.
                                            General Purpose Logging supported.
    Short self-test routine
    recommended polling time:        (   2) minutes.
    Extended self-test routine
    recommended polling time:        (  81) minutes.
    SCT capabilities:              (0x003d) SCT Status supported.
                                            SCT Error Recovery Control supported.
                                            SCT Feature Control supported.
                                            SCT Data Table supported.

    SMART Attributes Data Structure revision number: 16
    Vendor Specific SMART Attributes with Thresholds:
    ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
      1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
      2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
      3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1229
      4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       15
      5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       0
      7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0
      8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0
      9 Power_On_Minutes        0x0032   036   036   000    Old_age   Always       -       427h+41m
     10 Spin_Retry_Count        0x0033   100   100   030    Pre-fail  Always       -       0
     12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       7
    191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       0
    192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       1
    193 Load_Cycle_Count        0x0032   070   070   000    Old_age   Always       -       304324
    194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       27 (Min/Max 20/31)
    196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
    197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       0
    198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
    199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       2
    220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       109
    222 Loaded_Hours            0x0032   067   067   000    Old_age   Always       -       13230
    223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
    224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0
    226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       375
    240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0

    SMART Error Log Version: 1
    ATA Error Count: 2
            CR = Command Register [HEX]
            FR = Features Register [HEX]
            SC = Sector Count Register [HEX]
            SN = Sector Number Register [HEX]
            CL = Cylinder Low Register [HEX]
            CH = Cylinder High Register [HEX]
            DH = Device/Head Register [HEX]
            DC = Device Command Register [HEX]
            ER = Error register [HEX]
            ST = Status register [HEX]
    Powered_Up_Time is measured from power on, and printed as
    DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
    SS=sec, and sss=millisec. It "wraps" after 49.710 days.

    Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours)
      When the command that caused the error occurred, the device was active or idle.

      After command completion occurred, registers were:
      ER ST SC SN CL CH DH
      -- -- -- -- -- -- --
      84 51 01 1f 7a 05 e0  Error: ICRC, ABRT 1 sectors at LBA = 0x00057a1f = 358943

      Commands leading to the command that caused the error were:
      CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
      -- -- -- -- -- -- -- --  ----------------  --------------------
      35 00 00 20 76 05 e0 00   6d+01:49:26.915  WRITE DMA EXT
      35 00 00 00 72 05 e0 00   6d+01:49:26.741  WRITE DMA EXT
      35 00 08 80 0f 0c e0 00   6d+01:49:26.741  WRITE DMA EXT
      35 00 08 48 8a c4 e0 00   6d+01:49:26.741  WRITE DMA EXT
      ca 00 08 00 08 14 e9 00   6d+01:49:26.741  WRITE DMA

    Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours)
      When the command that caused the error occurred, the device was active or idle.

      After command completion occurred, registers were:
      ER ST SC SN CL CH DH
      -- -- -- -- -- -- --
      84 51 01 3f 8c 4e e0  Error: ICRC, ABRT 1 sectors at LBA = 0x004e8c3f = 5147711

      Commands leading to the command that caused the error were:
      CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
      -- -- -- -- -- -- -- --  ----------------  --------------------
      35 00 00 40 88 4e e0 00  12d+21:23:20.732  WRITE DMA EXT
      ca 00 08 a8 48 c8 e3 00  12d+21:23:20.731  WRITE DMA
      35 00 08 40 c1 1d e0 00  12d+21:23:20.731  WRITE DMA EXT
      35 00 08 b0 19 14 e0 00  12d+21:23:20.731  WRITE DMA EXT
      35 00 10 28 bf 13 e0 00  12d+21:23:20.731  WRITE DMA EXT

    SMART Self-test log structure revision number 1
    No self-tests have been logged.  [To run self-tests, use: smartctl -t]

    SMART Selective self-test log data structure revision number 1
     SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
        1        0        0  Not_testing
        2        0        0  Not_testing
        3        0        0  Not_testing
        4        0        0  Not_testing
        5        0        0  Not_testing
    Selective self-test flags (0x0):
      After scanning selected spans, do NOT read-scan remainder of disk.
    If Selective self-test is pending on power-up, resume after 0 minute delay.

这个硬盘是否很快就会出现故障并需要更换?

答案1

当您轮询 SMART 数据时,您不是从某个缓存中获取数据,而是直接从驱动器中获取数据。它永远不会显示旧驱动器的结果。在这种情况下,您的驱动器出现故障,是时候将其丢弃了。

答案2

另一方面,我没有看到任何迹象表明磁盘正在损坏。计数器中没有常见的磁盘损坏症状,例如:

  • Reallocated_Event_Count - 0
  • Current_Pending_Sector - 0
  • Offline_Uncorrectable - 0

但你看到的却是这样的:

  • UDMA_CRC_Error_Count - 2

我不会为此烦恼。循环冗余校验CRC 是一种在数据发送后进行验证和更正的方法。此警告告诉您,驱动器发送/接收的数据在某一时刻未通过此检查。最常见的原因是电缆或磁盘控制器故障。噪音或电阻可能会导致某个位翻转。

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