硬盘 SMART 测试失败

硬盘 SMART 测试失败

我的系统可能有问题,硬盘上的 SMART 故障。

使用的操作系统:SLES 11.2 i586。

问题是,最近我的设备的 SMART 状态打印出现了一些错误(smartctl -a /dev/sda)我正在附加。

我感兴趣的是打印的后半部分中提到的错误消息的含义(错误:ABRT等),这是否代表任何严重错误,或者该驱动器存在什么问题。

我曾尝试使用smartctl -l 自我测试/dev/sda,我也尝试过简短,但数据输出smartctl-a测试后没有变化。

请指教。

谢谢您的回复。

我附上了smartctl -a /dev/sda

smartctl 5.39 2008-10-24 22:33 [i686-suse-linux-gnu] (openSUSE RPM)
Copyright (C) 2002-8 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     ST250DM000-1BD141
Serial Number:    XYZ
Firmware Version: FJK2
User Capacity:    250,059,350,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Fri Sep  4 12:38:28 2020 GST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                 ( 600) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        (  45) minutes.
Conveyance self-test routine
recommended polling time:        (   2) minutes.
SCT capabilities:              (0x303f) SCT Status supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   112   099   006    Pre-fail  Always       -       47240608
  3 Spin_Up_Time            0x0003   100   100   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       167
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   087   060   030    Pre-fail  Always       -       626039220
  9 Power_On_Hours          0x0032   029   029   000    Old_age   Always       -       62401
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always       -       167
183 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
184 Unknown_Attribute       0x0032   100   100   099    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Unknown_Attribute       0x0032   100   099   000    Old_age   Always       -       4295032833
189 High_Fly_Writes         0x003a   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   072   066   045    Old_age   Always       -       28 (Lifetime Min/Max 27/32)
194 Temperature_Celsius     0x0022   028   040   000    Old_age   Always       -       28 (0 21 0 0)
195 Hardware_ECC_Recovered  0x001a   034   024   000    Old_age   Always       -       47240608
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
240 Head_Flying_Hours       0x0000   100   253   000    Old_age   Offline      -       270179212784577
241 Unknown_Attribute       0x0000   100   253   000    Old_age   Offline      -       527260569
242 Unknown_Attribute       0x0000   100   253   000    Old_age   Offline      -       3380033686

SMART Error Log Version: 1
ATA Error Count: 1
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 50640 hours (2110 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 00 00 00 00 00  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  00 00 00 00 00 00 00 ff   1d+00:27:00.197  NOP [Abort queued commands]
  b0 d4 00 81 4f c2 00 00   1d+00:26:52.471  SMART EXECUTE OFF-LINE IMMEDIATE
  b0 d1 01 01 4f c2 00 00   1d+00:26:52.407  SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
  b0 d0 01 00 4f c2 00 00   1d+00:26:52.379  SMART READ DATA
  b0 da 00 00 4f c2 00 00   1d+00:26:52.362  SMART RETURN STATUS

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short captive       Interrupted (host reset)      90%     50640         -
# 2  Short offline       Completed without error       00%     50640         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

答案1

50640 小时的错误是因为测试过程中计算机关闭或重启而发生的。这就是为什么它显示为“中断(主机重置)”。它没有说明硬盘的状态。

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