我似乎偶尔会遇到 SSD（Patriot Blaze）I/O 错误，尽管所有测试都显示磁盘健康、干净并且可以运行，而且只有 7 个月的历史。
更新：第三次磁盘冻结完全冻结，CAPSLOCK 灯闪烁。硬关机并重启可解决问题。
启动 16.04 LTS 有时会失败，显示“没有可启动设备”错误，重新启动或关机/开机解决了问题，并且我可以正常启动到 Ubuntu。
其他时候，当使用 Ubuntu 时系统停止工作，而我可以移动鼠标但无法打开任何东西。我还收到以下错误：
JavaScript error in the main process
Error: EIO: i/o error, read
at Error (native)
at Object.fs.readSync (fs.js:651:19)
at process.binding.internalModuleReadFile
(ELECTRON_ASAR.js: 538:10)
at readPackage (module.js:88:14)
at tryPackage (module.js:105:13)
at Function.Module._findPath (module.js:167:20)
at Function.Module._resolveFilename (module.js:337:25)
at Function.Module._load (module.js:290:25)
at Module.require (module.js:357:17)
at require (internal/module.js:16:19)
例如，上次发生这种情况时，我重新启动并得到了传输错误它说我应该运行 SSD 的 fsck，所以我照做了，它修复了一些错误，现在它运行正常。但是，这种情况会再次发生。
现在自我检测分析（> 磁盘）未发现任何问题（磁盘正常）。这是一台运行了 7 个月的 128 GB SSD，联想 z51-70 也是 8 个月的。
Smartmontools 测试没有问题，smartctl -t short -a /dev/sda：
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 30) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 2548
12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 1017
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 20
173 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 53018675
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 40
194 Temperature_Celsius 0x0023 070 070 000 Pre-fail Always - 30
196 Reallocated_Event_Count 0x0000 100 100 000 Old_age Offline - 0
218 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 1
241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 2791558
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2548 -
# 2 Short offline Completed without error 00% 2537 -
# 3 Extended offline Completed without error 00% 1098 -
# 4 Short offline Completed without error 00% 1098 -
# 5 Short offline Completed without error 00% 251 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
为什么突然这样？如果没有测试报告，SSD 会不会出现故障？
干杯。