deja-dup 在 Ubuntu 17.04 上触发磁盘 I/O 故障

deja-dup 在 Ubuntu 17.04 上触发磁盘 I/O 故障

我在一个完全加密的磁盘上新安装了 17.04(从头开始),并带有一个加密的主目录。

如果我运行 deja-dup 进行备份,系统肯定会崩溃。如果我查看 /var/log/syslog,它会显示有关将 ata1 速度降低到 3.0GB 的信息。不幸的是,我没有确切的消息,因为它使系统处于这样一种状态,即没有任何内容写入磁盘。

唯一的选择是强制关机并重新启动系统,此时 /var/log/syslog 不再包含 ata1 速度消息。

我用 SMART 检查了 SSD 的状态,一切正常。

我如何知道这是 deja-dup 问题还是其他问题?我该如何解决这个问题?

--编辑:我设法拍摄了一些照片(因为它不会将任何内容记录到磁盘)

它以Failed command: FLUSH CACHE EXT、开始COMRESET failed (errno=16),然后系统切换为只读,唯一的出路是强制关机。

首先,这种情况发生

然后

--编辑:这是所讨论的 SSD 的 SMART 数据:

smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.10.0-20-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Intel 520 Series SSDs
Device Model:     INTEL SSDSC2BW180A3L
Serial Number:    *****
LU WWN Device Id: *****
Firmware Version: LE1i
User Capacity:    180,045,766,656 bytes [180 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sun May 14 09:27:50 2017 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:        (    0) seconds.
Offline data collection
capabilities:            (0x7f) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Abort Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   1) minutes.
Extended self-test routine
recommended polling time:    (  48) minutes.
Conveyance self-test routine
recommended polling time:    (   2) minutes.
SCT capabilities:          (0x0021) SCT Status supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0032   100   100   000    Old_age   Always       -       0
  9 Power_On_Hours_and_Msec 0x0032   080   080   000    Old_age   Always       -       18301h+22m+34.340s
 12 Power_Cycle_Count       0x0032   098   098   000    Old_age   Always       -       2294
170 Available_Reservd_Space 0x0033   100   100   010    Pre-fail  Always       -       0
171 Program_Fail_Count      0x0032   100   100   000    Old_age   Always       -       0
172 Erase_Fail_Count        0x0032   100   100   000    Old_age   Always       -       0
174 Unexpect_Power_Loss_Ct  0x0032   100   100   000    Old_age   Always       -       816
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       261
184 End-to-End_Error        0x0033   100   100   097    Pre-fail  Always       -       0
187 Uncorrectable_Error_Cnt 0x0032   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       816
199 UDMA_CRC_Error_Count    0x0032   100   100   000    Old_age   Always       -       1
225 Host_Writes_32MiB       0x0032   100   100   000    Old_age   Always       -       311454
226 Workld_Media_Wear_Indic 0x0032   100   100   000    Old_age   Always       -       65535
227 Workld_Host_Reads_Perc  0x0032   100   100   000    Old_age   Always       -       52
228 Workload_Minutes        0x0032   100   100   000    Old_age   Always       -       65535
232 Available_Reservd_Space 0x0033   100   100   010    Pre-fail  Always       -       0
233 Media_Wearout_Indicator 0x0032   100   100   000    Old_age   Always       -       0
241 Host_Writes_32MiB       0x0032   100   100   000    Old_age   Always       -       311454
242 Host_Reads_32MiB        0x0032   100   100   000    Old_age   Always       -       348910
249 NAND_Writes_1GiB        0x0013   100   100   000    Pre-fail  Always       -       12890

SMART Error Log not supported

SMART Self-test Log not supported

SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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