所以几周前我更新到 17.10，并且几乎同时更新到 Android Studio 3，更新两者可能是一个错误，因为现在我不知道问题出在哪里。
基本上，磁盘 IO 似乎变得非常糟糕。起初我注意到我正在交换，所以我将内存增加了一倍（现在是 32 GB），并且我再也不交换了。但是当发生磁盘 IO 时，机器仍然会冻结。我说的冻结是指它会变得非常慢，以至于我可以打字，但几秒钟内看不到我输入的内容，当这种情况发生时，我经常会得到一个键的长字符串。
当我提交代码时，Android Studio 将对代码进行分析，而 UI 会在分析过程中冻结。这需要几秒钟的时间。在更新这两个功能之前，这些问题都不会发生。
此外，当云站备份运行到我的 NAS 时，速度会变得非常慢。
我有一个Samsung SSD 850 PRO 512GB固态硬盘。
那么我可以运行什么来查看问题是什么？
谢谢。
编辑：
Smartctl 输出：
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.13.0-16-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 PRO 512GB
Serial Number: S250NSAG809789J
LU WWN Device Id: 5 002538 8a0af305f
Firmware Version: EXM02B6Q
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 28 16:22:20 2017 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 272) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 23126
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 75
177 Wear_Leveling_Count 0x0013 098 098 000 Pre-fail Always - 117
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 070 057 000 Old_age Always - 30
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 34
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 37060089586
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
df-i 输出：
Filesystem Inodes IUsed IFree IUse% Mounted on
udev 4096227 613 4095614 1% /dev
tmpfs 4111096 1024 4110072 1% /run
/dev/sda1 29908992 4301747 25607245 15% /
tmpfs 4111096 524 4110572 1% /dev/shm
tmpfs 4111096 5 4111091 1% /run/lock
tmpfs 4111096 18 4111078 1% /sys/fs/cgroup
tmpfs 4111096 17 4111079 1% /run/user/122
tmpfs 4111096 458 4110638 1% /run/user/1000
/home/mydir/.Private 29908992 4301747 25607245 15% /home/mydir
答案1
安装Gnome 磁盘实用程序并检查磨损均衡计数和SMART数据或任何类似的测试。
报告的百分比越高，表示您的 SSD 磨损越严重，这意味着您更有可能遇到问题。
安装使用：
apt-get install gnome-disk-utility
通过命令行启动
sudo palimpsest
或通过名称下的应用程序菜单磁盘工具。
答案2
SMART 规范化数据倒计时，不是向上！
您可能正在寻找的特定命令是：
sudo smartctl -a /dev/sda | grep Media_Wearout_Indicator
这个值越高，可能您将遇到问题。顺便说一句，我建议您在遇到以下情况后考虑更换驱动器：
50% - 关键任务驱动（由于超出本文范围的原因，需要可以访问无论。
30% - 你的 /home 驱动器（你的电影/音乐/个人文件，以及你想随时保存的东西）
其余内容占 20%（在存入冷存储之前只用于备份的驱动器、存放偶尔使用的操作系统的驱动器等）
答案3
根据您的日志输出，您从未对驱动器运行过智能测试。有几种方法可以做到这一点。一种方法是通过我的回答中描述的 GUI这里。
另一种方法是按照答案所述通过命令行发出命令这里
任何测试的结果都会添加到日志中，如下面的命令输出片段所示，该命令sudo smartctl -a /dev/sda来自我的 TOSHIBA THNSNH128GBST SSD：
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 14965 -
# 2 Short offline Completed without error 00% 1955 -
# 3 Short offline Completed without error 00% 701 -