我刚刚在一台机器上安装了几个新的硬盘，碰巧注意到其中一个报告了两个错误，因此我运行smartctl -x它并得到了以下结果：
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-141-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Ultrastar 7K4000
Device Model: HGST HUS724040ALA640
Serial Number: [REDACTED]
LU WWN Device Id: [REDACTED]
Firmware Version: MFAOAC50
User Capacity: 4,000,787,030,016 bytes [4.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jan 1 05:33:21 2019 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 24) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 543) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 016 - 0
2 Throughput_Performance P-S--- 138 138 054 - 74
3 Spin_Up_Time POS--- 100 100 024 - 572
4 Start_Stop_Count -O--C- 100 100 000 - 8
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
7 Seek_Error_Rate PO-R-- 100 100 067 - 0
8 Seek_Time_Performance P-S--- 142 142 020 - 25
9 Power_On_Hours -O--C- 100 100 000 - 520
10 Spin_Retry_Count PO--C- 100 100 060 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 8
192 Power-Off_Retract_Count -O--CK 100 100 000 - 16
193 Load_Cycle_Count -O--C- 100 100 000 - 16
194 Temperature_Celsius -O---- 166 166 000 - 36 (Min/Max 22/56)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O---K 100 100 000 - 0
198 Offline_Uncorrectable ---R-- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL R/O 7 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x20 GPL R/O 1 Streaming performance log [OBS-8]
0x21 GPL R/O 1 Write stream error log
0x22 GPL R/O 1 Read stream error log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 2
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 [1] occurred at disk power-on lifetime: 16878 hours (703 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 0f 00 01 12 cd a0 31 02 00 Error: UNC at LBA = 0x112cda031 = 4610433073
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
60 00 10 00 10 00 01 12 cd a0 30 40 00 1d+08:13:30.021 READ FPDMA QUEUED
61 00 10 00 00 00 01 12 63 a0 30 40 00 1d+08:13:30.021 WRITE FPDMA QUEUED
60 00 10 00 00 00 01 12 cc a0 30 40 00 1d+08:13:30.017 READ FPDMA QUEUED
61 00 10 00 10 00 01 12 62 a0 30 40 00 1d+08:13:30.011 WRITE FPDMA QUEUED
60 00 10 00 00 00 01 12 cb a0 30 40 00 1d+08:13:30.004 READ FPDMA QUEUED
Error 1 [0] occurred at disk power-on lifetime: 10610 hours (442 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 01 34 00 01 12 f9 3a fc 02 00 Error: UNC at LBA = 0x112f93afc = 4613290748
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
60 00 08 00 10 00 00 00 00 01 2c 40 00 2d+01:26:34.533 READ FPDMA QUEUED
61 00 10 00 08 00 00 57 04 60 00 40 00 2d+01:26:33.675 WRITE FPDMA QUEUED
60 02 00 00 00 00 01 12 f9 3a 30 40 00 2d+01:26:33.386 READ FPDMA QUEUED
60 02 00 00 00 00 01 12 f9 38 30 40 00 2d+01:26:33.384 READ FPDMA QUEUED
60 02 00 00 00 00 01 12 f9 36 30 40 00 2d+01:26:33.382 READ FPDMA QUEUED
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 26741 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 36 Celsius
Power Cycle Min/Max Temperature: 35/38 Celsius
Lifetime Min/Max Temperature: 22/56 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -40/70 Celsius
Temperature History Size (Index): 128 (43)
Index Estimated Time Temperature Celsius
44 2019-01-01 03:26 37 ******************
... ..( 15 skipped). .. ******************
60 2019-01-01 03:42 37 ******************
61 2019-01-01 03:43 36 *****************
... ..( 20 skipped). .. *****************
82 2019-01-01 04:04 36 *****************
83 2019-01-01 04:05 35 ****************
... ..( 2 skipped). .. ****************
86 2019-01-01 04:08 35 ****************
87 2019-01-01 04:09 36 *****************
88 2019-01-01 04:10 36 *****************
89 2019-01-01 04:11 35 ****************
... ..( 40 skipped). .. ****************
2 2019-01-01 04:52 35 ****************
3 2019-01-01 04:53 36 *****************
... ..( 4 skipped). .. *****************
8 2019-01-01 04:58 36 *****************
9 2019-01-01 04:59 37 ******************
... ..( 30 skipped). .. ******************
40 2019-01-01 05:30 37 ******************
41 2019-01-01 05:31 36 *****************
42 2019-01-01 05:32 36 *****************
43 2019-01-01 05:33 36 *****************
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 8 --- Lifetime Power-On Resets
0x01 0x018 6 1598892472 --- Logical Sectors Written
0x01 0x020 6 1386302 --- Number of Write Commands
0x01 0x028 6 3655763419 --- Logical Sectors Read
0x01 0x030 6 7494155 --- Number of Read Commands
0x03 ===== = = === == Rotating Media Statistics (rev 1) ==
0x03 0x008 4 520 --- Spindle Motor Power-on Hours
0x03 0x010 4 520 --- Head Flying Hours
0x03 0x018 4 16 --- Head Load Events
0x03 0x020 4 0 --- Number of Reallocated Logical Sectors
0x03 0x028 4 0 --- Read Recovery Attempts
0x03 0x030 4 0 --- Number of Mechanical Start Failures
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 37 --- Current Temperature
0x05 0x010 1 35 N-- Average Short Term Temperature
0x05 0x018 1 - N-- Average Long Term Temperature
0x05 0x020 1 56 --- Highest Temperature
0x05 0x028 1 22 --- Lowest Temperature
0x05 0x030 1 41 N-- Highest Average Short Term Temperature
0x05 0x038 1 25 N-- Lowest Average Short Term Temperature
0x05 0x040 1 - N-- Highest Average Long Term Temperature
0x05 0x048 1 - N-- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 60 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 60 --- Number of Hardware Resets
0x06 0x010 4 13 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
如您所见，该驱动器的通电时间为 520 小时（这是准确的，因为我使用它不到一个月），但两个错误表明它们发生在 10610 小时和 16878 小时 - 显然不可能。
这里发生了什么事？ 这些错误是真的吗？令人担忧吗？我的供应商可能在进行某种“里程表篡改”吗？
更新
（我本来应该早点知道这一点，但是HGST Western Digital:/真的帮不上什么忙（如果他们根本不打算保留任何信息，为什么要向 OEM 驱动器提供序列号？），而且响应速度也很慢。）
当我安装这些产品时，我注意到它们没有像我的旧产品那样在标签上印有制造日期，但我只是把这归咎于制造商不再打印它们，并没有再多想这件事……直到我看到Deltik 的回答非常棒。 我从来没想过这些会被（或者可以有效地）抹去。
在试图从制造商（新主人）那里获得官方消息失败后，我将它们全部取出，并打开平板扫描仪，将其设置为最大设置。通过执行旧的缩放和增强功能，我能够发现每个文件都被删除的证据。以下是其中一个较容易阅读的示例：
（原始 5717×8117px，64.0MB .png 出于怜悯被省略）
精简版、编辑版 .jpg 概览：
犯罪现场原始分辨率裁剪.png（标签右上角）：
目光敏锐的你们可能已经读懂了，这里有一个自动水平仪的矩形：
是的。所有硬盘上都有这次蓄意欺诈行为留下的细微痕迹，而且都是 2015 年 3 月/4 月/5 月的。与 2018 年 11 月底的“新”相比，还算不上什么。
此外，正如其他一些评论者所说，我对 SMART 能被这样颠覆感到非常震惊。如果它能被重置，它的大部分意义不就消失了吗？
我会继续追寻这一目标，相信我。请继续关注。
答案1
我认为你对“里程表篡改”的怀疑是正确的，并且有可能的。记录的错误可能是真实的，而且绝对令人担忧，因为它们在读取时指示坏扇区。磁盘在到达您手中之前可能已被擦除，因此这些坏扇区可能已被重新映射。
无论是谁向您出售硬盘，他都会重置 SMART 属性，使其看起来像一个新的硬盘。
轶事
2015 年 7 月 25 日，我从 goHardDrive.com 购买了六块非常相似的硬盘。当我检查所有磁盘时，我发现了几乎完全相同的症状：
root@box52:~# smartctl -a /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-57-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 7K2000
Device Model: Hitachi HDS722020ALA330
Serial Number: JK1101B9G7U8NF
LU WWN Device Id: 5 000cca 222c38d7e
Firmware Version: JKAOA3MA
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Jul 30 13:57:13 2015 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART STATUS RETURN: incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (23653) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 394) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 2
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 0
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 1
194 Temperature_Celsius 0x0002 206 206 000 Old_age Always - 29 (Min/Max 25/29)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 31311 hours (1304 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 ff 01 58 5d 08 Error: UNC 255 sectors at LBA = 0x085d5801 = 140335105
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 58 5d 40 00 9d+05:13:00.528 READ DMA EXT
25 00 00 00 57 5d 40 00 9d+05:12:59.801 READ DMA EXT
25 00 00 00 56 5d 48 00 9d+05:12:59.797 READ DMA EXT
25 00 00 00 55 5d 48 00 9d+05:12:59.794 READ DMA EXT
25 00 00 00 54 5d 48 00 9d+05:12:59.789 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 31243 hours (1301 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 ff 01 58 5d 08 Error: UNC 255 sectors at LBA = 0x085d5801 = 140335105
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 58 5d 40 00 41d+18:29:24.394 READ DMA EXT
25 00 00 00 57 5d 48 00 41d+18:29:24.388 READ DMA EXT
25 00 00 00 56 5d 40 00 41d+18:29:24.383 READ DMA EXT
25 00 00 00 55 5d 40 00 41d+18:29:24.376 READ DMA EXT
25 00 00 00 54 5d 40 00 41d+18:29:24.371 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
如果不是因为 SMART 错误（他们忘记擦除或无法擦除），我会确信我买的磁盘是新的。
出于怀疑，我打电话给日立环球存储科技公司，得知至少有两块磁盘的保修期是在 2010 年 9 月 24 日生效的，这比我购买它们早了将近五年。制造商的保修期在 3 年后到期。
在给卖家的投诉中我写道：
擦除 SMART 属性值就像将汽车的里程表归零一样。擦除 SMART 属性的一个大问题是，像我这样的最终用户无法确定扇区是否已重新分配。可能存在任何情况，从没有重新分配的扇区到所有备用扇区都已重新分配。考虑到这些驱动器已有近五年的历史，并且有超过 73.7% 的时间至少有一个驱动器处于通电状态，因此很可能存在我不知道的重新映射扇区。
goHardDrive.com 向我出售了至少一块有缺陷的硬盘，并故意删除了所有六块硬盘的运行历史记录，并且在销售时没有透露任何硬盘的二手性质。
我还拍摄了硬盘的照片：
图像底部的硬盘是同一制造商的参考磁盘。
请注意，参考磁盘APR-2012上印有生产日期。我购买的六张磁盘上的生产日期都被删除了，但还不够清楚。看看中间的磁盘，你可以隐约看到AUG-2010。
这肯定证实了磁盘的历史：我购买了二手硬盘，其“里程表”已重置。
最后，卖家接受了我的退货请求，我退回了所有磁盘并获得全额退款。
购买硬盘时要小心！最好检查一下硬盘上是否有残留的磨损痕迹。