几天前，我的 acer Nitro-5 出现了启动修复问题。
下面是照片。
由于我的电脑有双启动，当我启动 Ubuntu 时，会出现以下建议：
所以我猜测启动修复问题可能和磁盘的第一个分区有关。
有人能提供解决这个问题的方法吗？谢谢！
我sudo smartctl -a /dev/sda1在我的 Ubuntu 终端内运行（/dev/sda1根据我上传的最后一张图片对应于 ESP 分区）并返回：
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-105-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JR1000BNHRXSXE
LU WWN Device Id: 5 000cca 8e6d883ac
Firmware Version: JB0OA3J0
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Apr 7 05:03:05 2022 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 165) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 130 130 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 2251
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 091 091 000 Old_age Always - 4140
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2098
191 G-Sense_Error_Rate 0x000a 099 099 000 Old_age Always - 65538
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 99
193 Load_Cycle_Count 0x0012 093 093 000 Old_age Always - 74738
194 Temperature_Celsius 0x0002 200 200 000 Old_age Always - 30 (Min/Max 10/47)
196 Reallocated_Event_Count 0x0032 072 072 000 Old_age Always - 851
197 Current_Pending_Sector 0x0022 001 001 000 Old_age Always - 13488
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 5262 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5262 occurred at disk power-on lifetime: 4140 hours (172 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 88 d4 a6 01 Error: UNC 40 sectors at LBA = 0x01a6d488 = 27710600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7b 35 d4 a6 40 00 00:06:19.933 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:06:16.967 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:06:14.004 READ DMA EXT
25 00 7e b8 d3 a6 40 00 00:06:14.003 READ DMA EXT
25 00 79 40 d3 a6 40 00 00:06:14.003 READ DMA EXT
Error 5261 occurred at disk power-on lifetime: 4140 hours (172 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 88 d4 a6 01 Error: UNC 40 sectors at LBA = 0x01a6d488 = 27710600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7b 35 d4 a6 40 00 00:06:16.967 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:06:14.004 READ DMA EXT
25 00 7e b8 d3 a6 40 00 00:06:14.003 READ DMA EXT
25 00 79 40 d3 a6 40 00 00:06:14.003 READ DMA EXT
25 00 01 40 d3 a6 40 00 00:06:13.992 READ DMA EXT
Error 5260 occurred at disk power-on lifetime: 4140 hours (172 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 88 d4 a6 01 Error: UNC 40 sectors at LBA = 0x01a6d488 = 27710600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7b 35 d4 a6 40 00 00:06:14.004 READ DMA EXT
25 00 7e b8 d3 a6 40 00 00:06:14.003 READ DMA EXT
25 00 79 40 d3 a6 40 00 00:06:14.003 READ DMA EXT
25 00 01 40 d3 a6 40 00 00:06:13.992 READ DMA EXT
25 00 40 00 29 66 40 00 00:06:13.982 READ DMA EXT
Error 5259 occurred at disk power-on lifetime: 4140 hours (172 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 88 d4 a6 01 Error: UNC 40 sectors at LBA = 0x01a6d488 = 27710600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7b 35 d4 a6 40 00 00:00:13.759 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:00:10.793 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:00:07.838 READ DMA EXT
25 00 7e b8 d3 a6 40 00 00:00:07.838 READ DMA EXT
25 00 79 40 d3 a6 40 00 00:00:07.837 READ DMA EXT
Error 5258 occurred at disk power-on lifetime: 4140 hours (172 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 28 88 d4 a6 01 Error: UNC 40 sectors at LBA = 0x01a6d488 = 27710600
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7b 35 d4 a6 40 00 00:00:10.793 READ DMA EXT
25 00 7b 35 d4 a6 40 00 00:00:07.838 READ DMA EXT
25 00 7e b8 d3 a6 40 00 00:00:07.838 READ DMA EXT
25 00 79 40 d3 a6 40 00 00:00:07.837 READ DMA EXT
25 00 01 40 d3 a6 40 00 00:00:07.826 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
答案1
我建议保存您的数据并更换磁盘。
您的磁盘受到了一些破坏，虽然 Windows 受到的影响显然比 Ubuntu 更大，但这并不意味着 Ubuntu 将来也不会出现故障。
具体来说，您有 51 个重新分配的扇区（损坏的扇区）、11 个寻道失败，以及其他各种错误。
磁盘出现故障。继续使用它就是拿你的数据赌博。