我刚刚更换了服务器上的硬盘。
它是 RAID 1 阵列的一部分。sdb1 分区现在每隔几个小时就会出现故障。
# cat /proc/mdstat
Personalities : [linear] [raid0] [raid1] [raid10] [raid6] [raid5] [raid4] [multi path] [faulty]
md1 : active raid1 sdb1[2](F) sda1[0]
463216576 blocks [2/1] [U_]
md3 : active raid1 sdb3[1] sda3[0]
20970432 blocks [2/2] [UU]
mdadm：
# mdadm -D /dev/md1
/dev/md1:
Version : 0.90
Creation Time : Tue Dec 25 15:04:23 2012
Raid Level : raid1
Array Size : 463216576 (441.76 GiB 474.33 GB)
Used Dev Size : 463216576 (441.76 GiB 474.33 GB)
Raid Devices : 2
Total Devices : 2
Preferred Minor : 1
Persistence : Superblock is persistent
Update Time : Wed Sep 25 14:30:49 2013
State : clean, degraded
Active Devices : 1
Working Devices : 1
Failed Devices : 1
Spare Devices : 0
UUID : 6ac92849:bf49a597:a4d2adc2:26fd5302
Events : 0.5728035
Number Major Minor RaidDevice State
0 8 1 0 active sync /dev/sda1
1 0 0 1 removed
2 8 17 - faulty spare /dev/sdb1
新更换的硬盘是否有故障？
我运行了 smartctl，但我不是解释结果的专家：
# smartctl -a /dev/sdb
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.10.9-xxxx-std-ipv6-64] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA DT01ACA050
Serial Number: 535DN5SNS
LU WWN Device Id: 5 000039 ff6d3d7bb
Firmware Version: MS1OA750
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Wed Sep 25 14:28:36 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4934) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 83) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 91
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 87
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 115 115 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 45
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 333
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 333
194 Temperature_Celsius 0x0002 206 206 000 Old_age Always - 29 (Min/Max 24/32)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 154
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
希望得到一些关于结果的反馈吗？
更新：
一位工程师查看了我的日志并发现了以下内容：
ata2.00: exception Emask 0x0 SAct 0x9 SErr 0x0 action 0x6 frozen
ata2.00: failed command: WRITE FPDMA QUEUED
ata2.00: cmd 61/80:00:80:19:1f/00:00:33:00:00/40 tag 0 ncq
65536 out
res 40/00:01:09:4f:c2/00:00:00:00:00/00 Emask 0x4
(timeout)
ata2.00: status: { DRDY }
ata2.00: failed command: WRITE FPDMA QUEUED
ata2.00: cmd 61/00:18:80:15:1f/04:00:33:00:00/40 tag 3 ncq
524288 out
res 40/00:00:00:00:00/00:00:00:00:00/00 Emask 0x4
(timeout)
ata2.00: status: { DRDY }
ata2: hard resetting link
ata2: link is slow to respond, please be patient (ready=0)
ata2: SATA link up 3.0 Gbps (SStatus 123 SControl 300)
ata2.00: configured for UDMA/133
ata2.00: device reported invalid CHS sector 0 sd 1:0:0:0: [sdb] Unhandled error code sd 1:0:0:0: [sdb]
他想更换 SATA 连接器。连接器故障是否可能导致驱动器出现坏扇区？或者坏的 SATA 连接器是否可能导致读取扇区失败，然后将其标记为坏扇区？
答案1
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 87 <<<===
这通常是驱动器内部跟踪的已增长缺陷列表中已添加的坏扇区数。注意：现代硬盘驱动器仅在发生写入时重新映射扇区，因此在很多情况下，此属性的原始值为 0，但驱动器有大量坏扇区等待重新分配（Current_Pending_Sector 计数器）。当对坏扇区发生写入时，驱动器会将该扇区添加到其内部“G 列表”，并使用为此目的而预留的工厂定义扇区池中的备用扇区替换该扇区。如果此数字大于 0，则表示您的驱动器已开始出现故障，并且您可能已经丢失了数据（取决于驱动器是否能够在重新分配之前读取所有数据）。
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 154 <<<===
这通常是驱动器的所有重新映射尝试的计数（成功和失败）。这可能与 Reallocated_Sector_Ct 不同 - 它通常会更高。也请注意这个属性。
观察上述计数器的增长速度。在我看来，更换这个驱动器确实值得，因为它似乎快要坏掉了。