我有一个 3.5 英寸硬盘，通过 SATA-USB 适配器 (JMicron) 连接到我的笔记本电脑。Gnome Disks“评估”部分显示：
磁盘正常，有一个坏扇区
“SMART 数据和自我测试”窗口如下所示：
带有奇怪的“更新时间：52 年零 9 个月零 23 天前”字段。
刷新和启动自检也不起作用：
但是，smartctl -a没有显示任何坏扇区（如果我没记错的话）：
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-5.19.15-201.fc36.x86_64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint F3
Device Model: SAMSUNG HD103SJ
Firmware Version: 1AJ10001
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5319
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9240) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 154) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 48
2 Throughput_Performance 0x0026 056 056 000 Old_age Always - 8387
3 Spin_Up_Time 0x0023 071 069 025 Pre-fail Always - 9027
4 Start_Stop_Count 0x0032 088 088 000 Old_age Always - 12587
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 11581
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 089 089 000 Old_age Always - 11952
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 107
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 063 053 000 Old_age Always - 37 (Min/Max 16/47)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 21
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 1423
223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
225 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 12629
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 11581 -
# 2 Short offline Completed without error 00% 11560 -
# 3 Extended offline Completed without error 00% 11530 -
# 4 Extended offline Completed without error 00% 11442 -
# 5 Extended offline Aborted by host 90% 11440 -
# 6 Short offline Completed without error 00% 11440 -
# 7 Short offline Completed without error 00% 133 -
# 8 Short offline Completed without error 00% 133 -
# 9 Short offline Aborted by host 60% 133 -
#10 Short offline Aborted by host 90% 133 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
发生了什么事？有人能解释一下吗？
答案1
您应该首先运行以下 SMART 测试：
sudo smartctl --test=long /dev/sdX
然后你可以运行
sudo smartctl --log=selftest
sudo smartctl --log=error
这个输出应该能给你更多的见解。
但请理解 SMART 测试是由磁盘固件本身执行的自我测试。如果固件设计为显示误报怎么办？而 GNOME 磁盘实用程序向您显示真实数据？
还有另一个程序也可以帮助检测坏块
sudo badblocks -v /dev/sdX > bad-sectors.txt
上述命令会将坏块信息写入文件（或 stdout，如果你移除重定向的话），同时在 stderr 中提供状态信息。请注意，此命令需要相当数量运行的时间。
我也遇到过类似的问题。坏块给了我以下输出，而 GNOME 磁盘实用程序仍然说1 个坏扇区
检查块 0 到 500107607 检查坏块（只读测试）：完成
通过，发现 0 个坏块。（0/0/0 错误）