SSD 上的所有操作系统都出现内核恐慌 - 这个 SSD 坏了吗?

SSD 上的所有操作系统都出现内核恐慌 - 这个 SSD 坏了吗?

我有一台安装了 SSD 和 HDD 的笔记本电脑。HDD 是数据分区,SSD 是所有操作系统(Ubuntu 版本和 Gentoo)的根分区。

由于某种原因,我在所有系统上都遇到了内核崩溃。我最初的猜测是 SSD 出现故障,但测试结果smartctl却并非如此:

smartctl 6.2 2013-07-26 r3841 [i686-linux-3.13-1-486] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     Samsung SSD 850 EVO M.2 120GB
Serial Number:    S24ANX0H608800R
LU WWN Device Id: 5 002538 d40f6cc30
Firmware Version: EMT21B6Q
User Capacity:    120,034,123,776 bytes [120 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sun Aug 14 07:55:08 2016 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:        (    0) seconds.
Offline data collection
capabilities:            (0x53) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   2) minutes.
Extended self-test routine
recommended polling time:    (  64) minutes.
SCT capabilities:          (0x003d) SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       340
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       191
177 Wear_Leveling_Count     0x0013   099   099   000    Pre-fail  Always       -       1
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   100   100   010    Pre-fail  Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0032   064   055   000    Old_age   Always       -       36
195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       19
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       270312183

SMART Error Log Version: 1
No Errors Logged

Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%       339         -

Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
  255        0    65535  Read_scanning was never started
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

我应该如何解决所有这些内核恐慌?

更新:

这是内核崩溃的屏幕照片:

内核恐慌

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