我正在尝试找出为什么 LUKS 加密 SSD 的 ext4 分区上的数据损坏。我运行了e2fsck /dev/mapper/disk1-root -y，然后e2fsck -fcc /dev/mapper/disk1-root得到以下输出：
e2fsck 1.45.3 (14-Jul-2019)
Checking for bad blocks (non-destructive read-write test)
Testing with random pattern: done
/dev/mapper/disk1-root: Updating bad block inode.
Pass 1: Checking inodes, blocks, and sizes
Pass 2: Checking directory structure
Pass 3: Checking directory connectivity
Pass 4: Checking reference counts
Pass 5: Checking group summary information
/dev/mapper/disk1-root: ***** FILE SYSTEM WAS MODIFIED *****
/dev/mapper/disk1-root: 139844/3391488 files (3.0% non-contiguous), 4920693/13554688 blocks
然后：
root@ubuntu:~# smartctl -a /dev/sdb
smartctl 7.0 2018-12-30 r4883 [x86_64-linux-5.3.0-18-generic] (local build)
Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: 64GB SATA Flash Drive
Serial Number: B041839840000000106C
LU WWN Device Id: 5 dc663a 04f80106c
Firmware Version: SFDN005E
User Capacity: 64,023,257,088 bytes [64.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Mar 13 14:06:33 2020 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 32) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2180
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 66
163 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 22
164 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 9
166 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
167 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
168 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
175 Program_Fail_Count_Chip 0x0032 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 41
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 30/60)
231 Temperature_Celsius 0x0012 100 100 000 Old_age Always - 100
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 407634110
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 1765 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.