我有一个已经运行多年的 SSD。它是发生故障的 RAID0 的一部分。阵列中的另一个 SSD 肯定是坏的 - 当我将它插入计算机时它根本不会显示出来。我想弄清楚我正在处理的这个 SSD 是否也是坏的。
使用 Linux 中的磁盘实用程序进行的扩展 SMART 测试告诉我“磁盘正常”。当我使用 在其上运行 badblockssudo badblocks -w -s -v /dev/sdc并让它运行一整夜时，我得到了一大堆错误。它到早上还没有完成，我不得不中断它，但它大约在这个阶段：one, 20:19:28 elapsed. (0/13/5396172 errors)。
我猜我疑惑的是：如果 badblocks 遇到这么多错误，为什么 SMART 看不到它们？我的 SSD 是不是坏了？
我的 SMART 测试结果如下：
$ sudo smartctl -a /dev/sdc
[sudo] password for tal:
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.6.13-200.fc31.x86_64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: S1DBNSAD968844W
LU WWN Device Id: 5 002538 8a0021de5
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jul 3 08:15:18 2020 MDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 089 089 000 Old_age Always - 53840
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 976
177 Wear_Leveling_Count 0x0013 094 094 000 Pre-fail Always - 65
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 062 047 000 Old_age Always - 38
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 001 001 000 Old_age Always - 3718773
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 183
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 22842562290
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Extended offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Completed without error 00% 212 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
答案1
以下 SMART 参数可能是导致问题的原因。
199 CRC_Error_Count 0x003e 001 001 000 Old_age 始终 - 3718773
不幸的是，我缺乏使用 SSD 的经验，无法判断这是否是一个典型值。
行为不同的原因可能是 SMART 仅在磁盘级别运行。运行 badblock 命令时，物理传输方式也会参与其中。